Invaluable Hands-on Experience: See What Participants Are Saying about the Applied Panel Data Econometrics Training Course

The AGRODEP training course on Applied Panel Data Econometrics was held from Septmeber 9-13. The course was instructed by Christopher F. Parmeter of the School of Business Administration at the University of Miami.

The five-day training course introduced participants to core panel data techniques as well as more cutting-edge panel data methodologies. The course focused on detailed implementation of panel data estimators and tests and their empirical implications using R codes, data, and literary documentation.

Thirteen AGRODEP members participated in the course: Fakayode Bamidele, Ciliaka Gitau, Mekbib Haile, Oswald Koussihouede, Mathews Madola, Busani Moyo, Richard Mulwa, Laudia Ogunniyi, Miriam Omolo, Indranarain Ramlall, Adebayo Shittu, Susan Watundu, and Urbain Thierry Yogo. The participants represent nine countries and a wide range of experience and interests. The training course was well-received by all participants; participant feedback will be very valuable in improving future training experiences of AGRODEP members. The quotes below highlight just some of the positive feedback received from participants.

Mekbib Haile of the Ethiopian Economics Association had this to say about the course:

"Besides teaching the several panel data models and under what assumptions each model works, Professor Parmeter also supported each of his lectures with a real data application using the R software. Though it seemed a very short time, we ended up learning not only several panel data models but also the R and latex softwares."

Fakayode Bamidele of the Federal University Oye-Ekiti, Nigeria, gave this feedback:

"Right from the onset, we were introduced to the use and applications of the free online R software which is, to me, a very versatile tool. . . .Our tutor took extra time in all the training days to teach. I am indeed indebted to him. "

Learn more about the training course and view pictures.